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The complete guide to analyzing and maximizing a company's balanced scorecard Presenting the next step for balanced scorecard implementation, Balanced Scorecard Diagnostics provides a step-by-step methodology for analyzing the effectiveness of a company's balanced scorecard and the tools to reevaluate balanced scorecard measures to drive maximum performance. CEOs, CFOs, CIOs, vice presidents, department managers, and business consultants will find all the essential tools for analyzing a balanced scorecard methodology to determine if it's running at maximum performance and for seamlessly implementing changes into the scorecard. Paul R. Niven (San Marcos, CA) is President of the Senalosa Group, a consulting firm exclusively dedicated to helping businesses get best-in-class performance. He is the author of two successful books, Balanced Scorecard Step-by-Step (0-471-07872-7) and Balanced Scorecard Step-by-Step for Government and Nonprofit Agencies (0-471-42328-9), both from Wiley.

Written by an international team of experts from the Tara Oceans Marine Biology Imaging Platform (TAOMI), this is the first and only compendium on marine imaging technologies, and includes all known underwater as well as on-land techniques. TAOMI is imaging the largest collection of marine organisms in recent history, ranging from viruses to corals, and is duplicated on land to perform high throughput confocal analysis of plankton, X-ray tomography as well as cryo-electron microscopy. This unique platform combines underwater imaging with cytometry, stereomicroscopy, fluorescence microscopy and 3D microscopy – all of which are covered in this practical book, along with remote sensing, MRI, and optical projection tomography. The definitive resource for every marine biologist who is planning to image marine species, whether underwater or on land.

To the dentist or maxillofacial practitioner, radiology is an essential diagnostic discipline and a valuable tool for treatment planning. Now more than ever, dentists are often the first to encounter lesions of the face and jaws and are frequently held liable for recognizing pathologies and other sites of concern. Oral and Maxillofacial Radiology: A Diagnostic Approach provides clinicians of varied disciplines and skill levels a practical and systematic approach to diagnosing lesions affecting the face and jaws. Firmly grounded in evidence-based research, the book presents a clear understanding of the clinical impact of each lesion within a prospective diagnosis. Oral and Maxillofacial Radiology is logically organized, beginning with the basics of radiological diagnosis before discussing each of the advanced imaging modalities in turn. Modalities discussed include helical and cone-beam computed tomography, magnetic resonance imaging, positron emission tomography, and ultrasonography. Later chapters cover radiological pathologies of the jaw, and also those of the head and neck immediately outside the oral and maxillofacial region. Written by a recognized expert in the field, Oral and Maxillofacial Radiology contains a multitude of clinical images, practical examples, and flowcharts to facilitate differential diagnosis.

This book brings together experts in the field who present material on a number of important and growing topics including lighting, displays, solar concentrators. The first chapter provides an overview of the field of nonimagin and illumination optics. Included in this chapter are terminology, units, definitions, and descriptions of the optical components used in illumination systems. The next two chapters provide material within the theoretical domain, including etendue, etendue squeezing, and the skew invariant. The remaining chapters focus on growing applications. This entire field of nonimaging optics is an evolving field, and the editor plans to update the technological progress every two to three years. The editor, John Koshel, is one of the most prominent leading experts in this field, and he is the right expert to perform the task.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L