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Hybridization, Diagnostic and Prognostic of PEM Fuel Cells. Durability and Reliability Hybridization, Diagnostic and Prognostic of PEM Fuel Cells. Durability and Reliability

Автор: Samir Jemei

Год издания: 0000

Hydrogen is the most abundant element in the universe. It has a place in the energy mix of the future, especially regarding fuel cells (FCs). This book is an investigation into FCs. Prominence is given to the subject of PEMFCs (proton exchange membrane fuel cells) as they offer interesting perspectives on transport and stationary applications. This being said, a number of technological and scientific obstacles remain to be overcome before an industrial level of development can be reached.
Balanced Scorecard Diagnostics. Maintaining Maximum Performance Balanced Scorecard Diagnostics. Maintaining Maximum Performance

Автор: Paul Niven R.

Год издания: 

The complete guide to analyzing and maximizing a company's balanced scorecard Presenting the next step for balanced scorecard implementation, Balanced Scorecard Diagnostics provides a step-by-step methodology for analyzing the effectiveness of a company's balanced scorecard and the tools to reevaluate balanced scorecard measures to drive maximum performance. CEOs, CFOs, CIOs, vice presidents, department managers, and business consultants will find all the essential tools for analyzing a balanced scorecard methodology to determine if it's running at maximum performance and for seamlessly implementing changes into the scorecard. Paul R. Niven (San Marcos, CA) is President of the Senalosa Group, a consulting firm exclusively dedicated to helping businesses get best-in-class performance. He is the author of two successful books, Balanced Scorecard Step-by-Step (0-471-07872-7) and Balanced Scorecard Step-by-Step for Government and Nonprofit Agencies (0-471-42328-9), both from Wiley.

Oral and Maxillofacial Radiology. A Diagnostic Approach Oral and Maxillofacial Radiology. A Diagnostic Approach

Автор: David Macdonald

Год издания: 

To the dentist or maxillofacial practitioner, radiology is an essential diagnostic discipline and a valuable tool for treatment planning. Now more than ever, dentists are often the first to encounter lesions of the face and jaws and are frequently held liable for recognizing pathologies and other sites of concern. Oral and Maxillofacial Radiology: A Diagnostic Approach provides clinicians of varied disciplines and skill levels a practical and systematic approach to diagnosing lesions affecting the face and jaws. Firmly grounded in evidence-based research, the book presents a clear understanding of the clinical impact of each lesion within a prospective diagnosis. Oral and Maxillofacial Radiology is logically organized, beginning with the basics of radiological diagnosis before discussing each of the advanced imaging modalities in turn. Modalities discussed include helical and cone-beam computed tomography, magnetic resonance imaging, positron emission tomography, and ultrasonography. Later chapters cover radiological pathologies of the jaw, and also those of the head and neck immediately outside the oral and maxillofacial region. Written by a recognized expert in the field, Oral and Maxillofacial Radiology contains a multitude of clinical images, practical examples, and flowcharts to facilitate differential diagnosis.

Cancer Stem Cells. Identification and Targets Cancer Stem Cells. Identification and Targets

Автор: Sharmila Bapat A.

Год издания: 

Because the concept and discoveries of cancer stem cells are relatively new, scientists and researchers need an introduction to this dynamic area. Cancer Stem Cells presents a consolidated account of the research done to date and recent progresses in the studies of cancer stem cells. Such a presentation facilitates a better understanding of and draws attention to stem cell and cancer biology – two fields that enhance, move, and evolve into each other continuously. It provides an informative study in designing approaches to apply stem cell principles to cancer biology while offering an overview of the challenges in developing combination stem and cancer biology targets for therapeutics. This book serves as a primer for new researchers in the field of cancer biology.

Semiconductor Laser Engineering, Reliability and Diagnostics. A Practical Approach to High Power and Single Mode Devices Semiconductor Laser Engineering, Reliability and Diagnostics. A Practical Approach to High Power and Single Mode Devices

Автор: Peter Epperlein W.

Год издания: 

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

Fundamentals of Reliability Engineering. Applications in Multistage Interconnection Networks Fundamentals of Reliability Engineering. Applications in Multistage Interconnection Networks

Автор: Indra Gunawan

Год издания: 

This book presents fundamentals of reliability engineering with its applications in evaluating reliability of multistage interconnection networks. In the first part of the book, it introduces the concept of reliability engineering, elements of probability theory, probability distributions, availability and data analysis. The second part of the book provides an overview of parallel/distributed computing, network design considerations, and more. The book covers a comprehensive reliability engineering methods and its practical aspects in the interconnection network systems. Students, engineers, researchers, managers will find this book as a valuable reference source.