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Bringing together business and engineering to reliability analysis With manufactured products exploding in numbers and complexity, reliability studies play an increasingly critical role throughout a product's entire life cycle-from design to post-sale support. Reliability: Modeling, Prediction, and Optimization presents a remarkably broad framework for the analysis of the technical and commercial aspects of product reliability, integrating concepts and methodologies from such diverse areas as engineering, materials science, statistics, probability, operations research, and management. Written in plain language by two highly respected experts in the field, this practical work provides engineers, operations managers, and applied statisticians with both qualitative and quantitative tools for solving a variety of complex, real-world reliability problems. A wealth of examples and case studies accompanies: * Comprehensive coverage of assessment, prediction, and improvement at each stage of a product's life cycle * Clear explanations of modeling and analysis for hardware ranging from a single part to whole systems * Thorough coverage of test design and statistical analysis of reliability data * A special chapter on software reliability * Coverage of effective management of reliability, product support, testing, pricing, and related topics * Lists of sources for technical information, data, and computer programs * Hundreds of graphs, charts, and tables, as well as over 500 references * PowerPoint slides are available from the Wiley editorial department.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

This book presents fundamentals of reliability engineering with its applications in evaluating reliability of multistage interconnection networks. In the first part of the book, it introduces the concept of reliability engineering, elements of probability theory, probability distributions, availability and data analysis. The second part of the book provides an overview of parallel/distributed computing, network design considerations, and more. The book covers a comprehensive reliability engineering methods and its practical aspects in the interconnection network systems. Students, engineers, researchers, managers will find this book as a valuable reference source.

Focuses on the core systems engineering tasks of writing, managing, and tracking requirements for reliability, maintainability, and supportability that are most likely to satisfy customers and lead to success for suppliers This book helps systems engineers lead the development of systems and services whose reliability, maintainability, and supportability meet and exceed the expectations of their customers and promote success and profit for their suppliers. This book is organized into three major parts: reliability, maintainability, and supportability engineering. Within each part, there is material on requirements development, quantitative modelling, statistical analysis, and best practices in each of these areas. Heavy emphasis is placed on correct use of language. The author discusses the use of various sustainability engineering methods and techniques in crafting requirements that are focused on the customers’ needs, unambiguous, easily understood by the requirements’ stakeholders, and verifiable. Part of each major division of the book is devoted to statistical analyses needed to determine when requirements are being met by systems operating in customer environments. To further support systems engineers in writing, analyzing, and interpreting sustainability requirements, this book also Contains “Language Tips” to help systems engineers learn the different languages spoken by specialists and non-specialists in the sustainability disciplines Provides exercises in each chapter, allowing the reader to try out some of the ideas and procedures presented in the chapter Delivers end-of-chapter summaries of the current reliability, maintainability, and supportability engineering best practices for systems engineers Reliability, Maintainability, and Supportability is a reference for systems engineers and graduate students hoping to learn how to effectively determine and develop appropriate requirements so that designers may fulfil the intent of the customer.

System reliability, availability and robustness are often not well understood by system architects, engineers and developers. They often don't understand what drives customer's availability expectations, how to frame verifiable availability/robustness requirements, how to manage and budget availability/robustness, how to methodically architect and design systems that meet robustness requirements, and so on. The book takes a very pragmatic approach of framing reliability and robustness as a functional aspect of a system so that architects, designers, developers and testers can address it as a concrete, functional attribute of a system, rather than an abstract, non-functional notion.

A comprehensively updated and reorganized new edition. The updates include comparative methods for improving reliability; methods for optimal allocation of limited resources to achieve a maximum risk reduction; methods for improving reliability at no extra cost and building reliability networks for engineering systems. Includes: A unique set of 46 generic principles for reducing technical risk Monte Carlo simulation algorithms for improving reliability and reducing risk Methods for setting reliability requirements based on the cost of failure New reliability measures based on a minimal separation of random events on a time interval Overstress reliability integral for determining the time to failure caused by overstress failure modes A powerful equation for determining the probability of failure controlled by defects in loaded components with complex shape Comparative methods for improving reliability which do not require reliability data Optimal allocation of limited resources to achieve a maximum risk reduction Improving system reliability based solely on a permutation of interchangeable components